Patent Granted in Japan in 17 Days
“Super Accelerated Examination System”, a pilot programme of Japanese Patent Office was launched on 1st October, 2008 to process the patent applications at a faster pace than what is already done under the conventional accelerated examination system. The first ever patent granted under this super accelerated examination system was filed by Keio University. The request for examination for this application was made on 1st October, 2008 and the patent was granted in 17 days from the said request for examination.
The patent was granted for an application filed by Keio University. (Application number 2007-054284, Publication number 2008-216061, Title of the invention: Electrochemical Analysis Method Using Boron Doped Electroconductive Diamond Electrode). Source
* Under the conventional accelerated examination, the average pendency to first office action is 2.2 months.
The patent was granted for an application filed by Keio University. (Application number 2007-054284, Publication number 2008-216061, Title of the invention: Electrochemical Analysis Method Using Boron Doped Electroconductive Diamond Electrode). Source
* Under the conventional accelerated examination, the average pendency to first office action is 2.2 months.
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